As we know, microscopy played a key role in the development of advanced technologies and new materials for the progress of mankind. In the present talk, a brief description of the essential features of the theory of field emission, field ionization and field desorption would be given. The importance of field electron / ion microscopy (FEM/FIM) and atom probe field ion microscopy (APFIM) would be highlighted in gaining a deeper understanding of materials at atomic scale.
About the speaker
Dr. R.B. Sharma obtained M.Sc. (Physics) from Agra University (1979), M.Phil (Physics) from Rajasthan University (1986) and PhD from Pune University (1997). He has taught Physics courses at undergraduate/ Post graduate/ doctoral level for more than 30 years. He has supervised 6 Ph.D. (4 completed, 2 in progress) and 8 M.Tech./ M.S. theses. Presently, he is working as Scientist ‘G’ at DRDO headquarters, New Delhi and also as an adjunct faculty at the Department of Applied Physics, DIAT (DU) Pune, India. He is the coordinator, Nano Science & Technology initiative at DRDO Hqrs, New Delhi. He has published more than 80 research papers in International journals/ conferences.